When:
January 26, 2023 @ 2:00 pm – 3:00 pm
2023-01-26T14:00:00-06:00
2023-01-26T15:00:00-06:00

XSD/MIC Special Virtual Presentation : Ptychographic imaging for future candidate of Semiconductor Metrology and Inspection

Speaker: Dr. Jangwoon Sung, Samsung Electronics Co., Ltd.

Title:, Ptychographic imaging for future candidate of Semiconductor Metrology and Inspection

Date:, Thursday, January 26, 2023

Time:, 2:00 p.m.

Location:

Microsoft Teams meeting

Join on your computer, mobile app or room device

Click here to join the meeting

Meeting ID: 210 500 545 04
Passcode: q4GDdX

Download Teams | Join on the web

Or call in (audio only)

+1 630-556-7958,,801272504#   United States, Big Rock

Phone Conference ID: 801 272 504#