XSD/MIC Special Virtual Presentation : Ptychographic imaging for future candidate of Semiconductor Metrology and Inspection
Speaker: Dr. Jangwoon Sung, Samsung Electronics Co., Ltd.
Title:, Ptychographic imaging for future candidate of Semiconductor Metrology and Inspection
Date:, Thursday, January 26, 2023
Time:, 2:00 p.m.
Location:
Microsoft Teams meeting
Join on your computer, mobile app or room device
Click here to join the meeting
Meeting ID: 210 500 545 04
Passcode: q4GDdX
Download Teams | Join on the web
Or call in (audio only)
+1 630-556-7958,,801272504# United States, Big Rock
Phone Conference ID: 801 272 504#